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文章目录
- 目标
- Faults
- Fault Locations
- Specifying the Fault Universe: Add Faults
- Specifying the Fault Universe: Excluding Faults
- Specifying the Fault Universe: Fault Sampling
- Fault Classes
- Fault Class(TE): Detect By lmplication (DI)
- Fault Class(TE): Detected By Simulation (DS)
- Fault Class(TE): Possible Detected Faults (PT, PU)
- Fault Class(TE):ATPG Untestable (AU)
- Fault Class(TE): Uncontrolled (UC) and Unobserved(Uo)
- Fault Class(TE):UC,Uo and Aborted Faults
- Fault Class(UT): Untestable Faults
- Fault Class: Review
- Test Coverage Reporting: Metrics
- Calculating Testability
- Transcript/Logfile Overview
- Understanding the Logfile
- Logfile Review, ATPG Warnings, and Auto Adjustment
- **点击这里:E课网IC设计学习卡**
目标
Upon completion of this module, you should be able to:
- Explain how to include and exclude faults for ATPG
- Explain how detected and undetected faults are classified.
- Interpret the statistics information reported after pattern generation.
- Interpret information transcribed into log files and to the transcript window.
完成本模块后,您应该能够:
- 解释如何在自动测试图案生成(ATPG)中包含和排除故障
- 解释已检测和未检测到的故障是如何分类的
- 解释模式生成后报告的统计信息
- 解释记录到日志文件以及转录窗口中的信息
Faults
Prior to test pattern generation, the tool performs circuit learning and determines:
- Fault Locations (external or internal to the gate level model)
- Total number of faults in design
- Specific fault types
You have the option to:
- specify fault locations in reference to gate level models.
- Add fault
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